ty chyby hlásí SMART už pěkně dlouho a nic jiného se se systémem neděje. pokud jsem se pokul pochopit to, co mi SMART hlásí, tak většina jsou chyby jiné než problémy se čtením disku. vypadá to nějak takto:
smartctl version 5.38 [x86_64-unknown-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Raptor family
Device Model: WDC WD1500ADFD-00NLR5
Serial Number: WD-WMAP42073271
Firmware Version: 21.07QR5
User Capacity: 150,039,945,216 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 published, ANSI INCITS 397-2005
Local Time is: Tue Jan 1 17:36:35 2013 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (4783) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 72) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 188 039 051 Pre-fail Always In_the_past 58
3 Spin_Up_Time 0x0007 165 164 021 Pre-fail Always - 4791
4 Start_Stop_Count 0x0032 100 100 040 Old_age Always - 43
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000a 200 200 051 Old_age Always - 0
9 Power_On_Hours 0x0032 044 044 000 Old_age Always - 41248
10 Spin_Retry_Count 0x0012 100 253 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 43
194 Temperature_Celsius 0x0022 090 089 000 Old_age Always - 57
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 198 198 000 Old_age Always - 58
198 Offline_Uncorrectable 0x0012 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 198 051 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2780 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2780 occurred at disk power-on lifetime: 40372 hours (1682 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 48 80 19 e2 Error: UNC 8 sectors at LBA = 0x02198048 = 35225672
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 47 80 19 42 00 14d+01:48:26.850 READ DMA
27 00 00 00 00 00 40 00 14d+01:48:26.850 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 14d+01:48:26.850 IDENTIFY DEVICE
ef 03 46 00 00 00 00 00 14d+01:48:26.850 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 40 00 14d+01:48:26.850 READ NATIVE MAX ADDRESS EXT
Error 2779 occurred at disk power-on lifetime: 40372 hours (1682 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 48 80 19 e2 Error: UNC 8 sectors at LBA = 0x02198048 = 35225672
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 47 80 19 42 00 14d+01:48:23.700 READ DMA
27 00 00 00 00 00 40 00 14d+01:48:23.700 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 14d+01:48:23.700 IDENTIFY DEVICE
ef 03 46 00 00 00 00 00 14d+01:48:23.700 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 40 00 14d+01:48:23.700 READ NATIVE MAX ADDRESS EXT
Error 2778 occurred at disk power-on lifetime: 40372 hours (1682 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 47 80 19 e2 Error: UNC 8 sectors at LBA = 0x02198047 = 35225671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 47 80 19 42 00 14d+01:48:20.600 READ DMA
27 00 00 00 00 00 40 00 14d+01:48:20.600 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 14d+01:48:20.600 IDENTIFY DEVICE
ef 03 46 00 00 00 00 00 14d+01:48:20.600 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 40 00 14d+01:48:20.600 READ NATIVE MAX ADDRESS EXT
Error 2777 occurred at disk power-on lifetime: 40372 hours (1682 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 47 80 19 e2 Error: UNC 8 sectors at LBA = 0x02198047 = 35225671
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 47 80 19 42 00 14d+01:48:17.600 READ DMA
ca 00 08 97 32 04 40 00 14d+01:48:17.600 WRITE DMA
ca 00 10 87 32 04 40 00 14d+01:48:17.600 WRITE DMA
ca 00 08 7f 32 04 40 00 14d+01:48:17.600 WRITE DMA
ca 00 78 07 32 04 40 00 14d+01:48:17.600 WRITE DMA
Error 2776 occurred at disk power-on lifetime: 40372 hours (1682 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 48 80 19 e2 Error: UNC 8 sectors at LBA = 0x02198048 = 35225672
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 47 80 19 42 00 14d+01:43:38.900 READ DMA
27 00 00 00 00 00 40 00 14d+01:43:38.900 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 00 00 14d+01:43:38.900 IDENTIFY DEVICE
ef 03 46 00 00 00 00 00 14d+01:43:38.900 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 40 00 14d+01:43:38.900 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 90% 41244 35225671
# 2 Conveyance offline Completed: read failure 90% 20834 35224872
# 3 Extended offline Completed: read failure 90% 20830 35224872
# 4 Short offline Completed without error 00% 13453 -
# 5 Short offline Completed without error 00% 13354 -
# 6 Extended offline Completed: read failure 90% 13316 19630288
# 7 Short offline Completed without error 00% 13316 -
# 8 Short offline Completed without error 00% 13316 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.