1. sudo smartctl -o off /dev/sdc okamžitě pobudí disk a vypíše
=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Automatic Offline Testing Disabled.
2. sudo smartctl -a /dev/sdc vypíše
=== START OF INFORMATION SECTION ===
Model Family: Toshiba P300 (CMR)
Device Model: TOSHIBA HDWD110
Serial Number: 80HM91VFS
LU WWN Device Id: 5 000039 fdff30b92
Firmware Version: MS2OA8R0
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5319
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Jun 16 21:37:25 2022 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x04) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 7070) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 118) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 141 141 054 Pre-fail Offline - 73
3 Spin_Up_Time 0x0007 114 114 024 Pre-fail Always - 200 (Average 202)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 592
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 110 110 020 Pre-fail Offline - 36
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 8670
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 70
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 594
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 594
194 Temperature_Celsius 0x0002 200 200 000 Old_age Always - 30 (Min/Max 20/43)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 6
SMART Error Log Version: 1
ATA Error Count: 6 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 6 occurred at disk power-on lifetime: 41 hours (1 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 f7 82 6f 0b Error: ICRC, ABRT 1 sectors at LBA = 0x0b6f82f7 = 191857399
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 08 f0 82 6f e0 00 01:13:59.295 WRITE DMA EXT
35 00 08 90 82 6f e0 00 01:13:59.287 WRITE DMA EXT
35 00 08 e8 81 6f e0 00 01:13:59.280 WRITE DMA EXT
35 00 10 98 81 6f e0 00 01:13:59.266 WRITE DMA EXT
35 00 08 88 81 6f e0 00 01:13:59.258 WRITE DMA EXT
Error 5 occurred at disk power-on lifetime: 41 hours (1 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 87 28 86 03 Error: ICRC, ABRT 33 sectors at LBA = 0x03862887 = 59123847
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 80 28 28 86 e0 00 01:13:23.704 WRITE DMA EXT
35 00 80 a8 27 86 e0 00 01:13:23.615 WRITE DMA EXT
35 00 80 28 27 86 e0 00 01:13:23.524 WRITE DMA EXT
35 00 80 a8 26 86 e0 00 01:13:23.431 WRITE DMA EXT
35 00 80 28 26 86 e0 00 01:13:23.339 WRITE DMA EXT
Error 4 occurred at disk power-on lifetime: 41 hours (1 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 87 f9 85 03 Error: ICRC, ABRT 33 sectors at LBA = 0x0385f987 = 59111815
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 80 28 f9 85 e0 00 01:13:14.914 WRITE DMA EXT
35 00 80 a8 f8 85 e0 00 01:13:14.826 WRITE DMA EXT
35 00 80 28 f8 85 e0 00 01:13:14.733 WRITE DMA EXT
35 00 80 a8 f7 85 e0 00 01:13:14.651 WRITE DMA EXT
35 00 80 28 f7 85 e0 00 01:13:14.558 WRITE DMA EXT
Error 3 occurred at disk power-on lifetime: 41 hours (1 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 a7 ea 85 03 Error: ICRC, ABRT 1 sectors at LBA = 0x0385eaa7 = 59108007
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 80 28 ea 85 e0 00 01:13:11.948 WRITE DMA EXT
35 00 80 a8 e9 85 e0 00 01:13:11.866 WRITE DMA EXT
35 00 80 28 e9 85 e0 00 01:13:11.785 WRITE DMA EXT
35 00 80 a8 e8 85 e0 00 01:13:11.703 WRITE DMA EXT
35 00 80 28 e8 85 e0 00 01:13:11.615 WRITE DMA EXT
Error 2 occurred at disk power-on lifetime: 41 hours (1 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 21 07 94 85 03 Error: ICRC, ABRT 33 sectors at LBA = 0x03859407 = 59085831
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 80 a8 93 85 e0 00 01:12:55.978 WRITE DMA EXT
35 00 80 28 93 85 e0 00 01:12:55.884 WRITE DMA EXT
35 00 80 a8 92 85 e0 00 01:12:55.794 WRITE DMA EXT
35 00 80 28 92 85 e0 00 01:12:55.711 WRITE DMA EXT
35 00 80 a8 91 85 e0 00 01:12:55.628 WRITE DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
3. sudo smartctl -g all /dev/sdc vypíše
AAM feature is: Unavailable
APM feature is: Disabled
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]